Semi-generic in-circuit test fixture

Details Semi-generic in-circuit test fixture Semi-generic in-circuit test fixture

G - Physics

01

R

G01R 31/28 (2006.01)

Patent

CA 2592901

A semi-generic test fixture for testing printed circuit boards (PCBs) and/or for testing printed circuit boards assemblies (PCBAs) is presented. The semi-generic test fixture implements a combination of generic and customized parts for tester-to-fixture interface instead of a static dedicated in-circuit test (ICT) fixture which is able to interconnect only one kind of unit under test (UUT) to an ICT tester test-head. The semi-generic ICT fixture (SGICTF) is able to interconnect an ICT test-head with a variety of UUT types with a minimum of adaptation. Accordingly, the SGICTF generally comprises two generic PCB connected to the tester and two customized PCB connected to the generic PCB and adapted to interface the particular UUT via testing probes.

Affiliated with

Also associated with

Rating

Semi-generic in-circuit test fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semi-generic in-circuit test fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semi-generic in-circuit test fixture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-2052109