Self-compensating x-ray or gamma ray thickness gauge

Details Self-compensating x-ray or gamma ray thickness gauge Self-compensating x-ray or gamma ray thickness gauge

G - Physics

01

N

358/6

G01N 23/06 (2006.01) G01N 23/16 (2006.01) G01N 23/203 (2006.01)

Patent

CA 1076712

Abstract of the Disclosure A gauge for determining the mass per unit area, or alternatively the thickness of sheet material by measuring the attenuation, as well as back- scatter, of an X-ray beam or the like, while continuously taking into account deviations and changes in localized material composition, insofar as these have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e. nominal composition. The resultant output signal represents the mass per unit area or thickness.

281769

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