G - Physics – 01 – B
Patent
G - Physics
01
B
33/63, 340/134.2
G01B 11/30 (2006.01)
Patent
CA 1055688
SURFACE PROFILE MEASURING DEVICE AND METHOD ABSTRACT OF THE DISCLOSURE An arrangement for measuring the profile of surfaces having a characteristic one-directional lay with sufficient resolution to determine the surface roughness thereof is disclosed, comprising a device for illuminating a small spot on the surface, with an image of the spot projected through an objective lens onto a large area light detector positioned to generate a signal corresponding to the total illumination produced by the image. The device also includes a second light detector which views a second image of the spot focused by the objective lens through a slit disposed perpendicularly to the direction of the surface lay. The respective detector signals are divided to produce signals corresponding to the ratio thereof, which, according to the present invention, correspond to the variations of the surface height occurring as the illuminated spot is scanned across the surface. A graphical profile of the surface may be obtained by recording these signals as a function of the scanned distance.
269996
LandOfFree
Surface profile measuring device and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface profile measuring device and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface profile measuring device and method will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-355067