Microcircuit fine leak test apparatus

Details Microcircuit fine leak test apparatus Microcircuit fine leak test apparatus

G - Physics

01

M

73/118, 73/77, 3

G01M 3/20 (2006.01)

Patent

CA 1093859

ABSTRACT OF THE DISCLOSURE A plurality of fine leak test chambers for fast individual testing of hermetically plated microelectronic devices. Each microcircuit component, having already been subjected to a controlled environment of 5 percent, having already been subjected to a controlled environment of the chambers and sealed therein. The chambers are evacuated and helium flow rate (if present) is measured by a spectrometer.

315005

Affiliated with

Also associated with

Rating

Microcircuit fine leak test apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microcircuit fine leak test apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microcircuit fine leak test apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-480504