G - Physics – 01 – N
Patent
G - Physics
01
N
324/29.8
G01N 22/04 (2006.01)
Patent
CA 1149020
PHD 79 084 18 30-6-1980 ABSTRACT: "A microwave method for measuring the relative moisture content of an object." The known moisture meters are not reliable in the case of variation in the density and a non-uniform distribution of the object to be measured in the measuring space. Methods are described in which in known manner the complex transmission factor of the object to be measured and, which is new, also simultaneously the complex reflec- tion factor is measured. A preceding measurement in a given form for making a calibrating curve remains required. The theoretical basic ideas, confirmed by measured values, are shown for various "measuring spaces", namely for free waves and TEM guides, that is coaxial guides, for waveguides with the special case of low-loss samples and with a low dielec- tric constant and for a closed resonator.
355930
Meyer Wolfgang
Schilz Wolfram
N.v. Philips Gloeilampenfabrieken
Van Steinburg C.e.
LandOfFree
Microwave method for measuring the relative moisture content... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microwave method for measuring the relative moisture content..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microwave method for measuring the relative moisture content... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-516194