Dual beam line scanner for phased array applications

Details Dual beam line scanner for phased array applications Dual beam line scanner for phased array applications

H - Electricity

01

Q

351/18

H01Q 3/22 (2006.01) H01Q 3/34 (2006.01) H01Q 3/44 (2006.01) H01Q 25/00 (2006.01)

Patent

CA 1115414

ABSTRACT OF THE DISCLOSURE A millimeter wave line scanner is disclosed providing steered fan- shaped beams from opposite faces at substantially equal angles of a semi- conductor waveguide, rectangular in cross section, and having a plurality of equally spaced metallic perturbations or strips disposed on one of the two radiating sides or faces. Different angles of scan are selectively obtained by means of at least one distributed longitudinal PIN diode formed on an adjoining side of the semiconductor waveguide having electrical circuit means coupled thereto for controlling the diode's conductivity which acts to change the guide wavelength and accordingly cause a variation in radiation angle of the two equal beams radiating in opposite directions and by means coupling energy of changing frequency to the semiconductor waveguide.

325817

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