Method for manufacturing semiconductor device

H - Electricity – 01 – L

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356/177, 204/96.

H01L 21/31 (2006.01) H01L 21/3105 (2006.01) H01L 21/76 (2006.01) H01L 21/762 (2006.01)

Patent

CA 1165014

Abstract of the Disclosure A method of forming a flat field region in a semiconductor substrate, which comprises forming a recess in the substrate, forming a covering on the whole surface of the substrate with a first insulating film such as plasma CVD SiO2 film which gives a layer at the side portion of the recess more rapidly etchable as compared with other portions, selectively removing the layer at the side portion to thereby form a V-shaped groove between the side of the recess and the first insulating film, and filling the V-shaped groove with a second insulating material so as to obtain a flat field region which is flush with the surface of an element-forming region.

393269

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Method for manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for manufacturing semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-881671

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.