G - Physics – 01 – R
Patent
G - Physics
01
R
324/37
G01R 23/12 (2006.01) G01R 23/00 (2006.01)
Patent
CA 1116238
FREQUENCY MEASURING APPARATUS Abstract of the Disclosure Frequency measuring apparatus wherein a single sideband modulator is fed by an input signal, the frequency of which is to be determined, and a reference signal having a predetermined frequency f0 to produce upper and lower sideband frequency signals separated in frequency by 2f0. A delay line shifts the phase of one of such signals 0 relative to the other one of such signals, such phase shift being related to the frequency of the input signal. The signals are then combined and detected to produce a signal having a frequency 2f0 and a phase angle related to the phase shift 0. A phase comparator, responsive to the reference signal and the later produced signal, detects the phase of the later signal thereby providing an indication of the frequency of the input signal. With such an arrangement relatively fewer and less costly devices may be used for the frequency measuring apparatus.
310582
Raytheon Company
Smart & Biggar
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