A method and a system for height triangulation measurement

G - Physics – 01 – C

Patent

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G01C 3/08 (2006.01) G01B 11/24 (2006.01) G01B 11/30 (2006.01)

Patent

CA 2563907

A method and a system for height triangulation measurement are disclosed. The method and the system are particularly useful for measuring the height of an object on a surface e.g., bumps or small wafer. Three steps do the measurement. The first step is illuminating the object from a known angle with a narrow strip of light being spatially incoherent, having a large numerical aperture along the light strip and a small numerical aperture perpendicular to the light strip. The second step is imaging the object from a known angle having said large numerical aperture along the light strip and the small numerical aperture perpendicular to the light strip, having an image that includes the object and the light strip and the last step is calculating the height of the object from the location of the light strip on the image.

L'invention concerne un procédé et un système de mesure de hauteur par triangulation, particulièrement utiles pour la mesure de la hauteur d'un objet sur une surface, telle que des bosses ou une petite tranche. La mesure s'effectue en trois étapes. La première étape consiste à illuminer l'objet selon un angle connu, avec une bande étroite de lumière incohérente au plan spatial, et une grande ouverture numérique le long de la bande de lumière ainsi qu'une petite ouverture numérique perpendiculaire à la bande de lumière. La deuxième étape consiste à mettre l'objet en image selon un angle connu ayant ladite grande ouverture numérique le long de la bande de lumière et la petite ouverture numérique perpendiculaire à la bande de lumière, et à produire une image comprenant l'objet et la bande de lumière. La dernière étape consiste à calculer la hauteur de l'objet à partir de l'emplacement de la bande de lumière sur l'image.

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