A method and apparatus for analysing a material

Details A method and apparatus for analysing a material A method and apparatus for analysing a material

G - Physics

01

N

G01N 23/00 (2006.01) G01N 23/06 (2006.01)

Patent

CA 2736608

A method of analysing particles of a material which include a constituent is disclosed. The method comprises the steps of exposing particles of the material to x radiation having a range of x- radiation energies, detecting x-radiation intensities at two different energy levels transmitted through the particles, and determining the concentration of the constituent in particles from the detected intensities.

L'invention porte sur un procédé d'analyse de particules d'un matériau qui comprend un constituant. Le procédé comporte les étapes d'exposition de particules du matériau à un rayonnement X ayant une plage d'énergies de rayonnement X, de détection d'intensités de rayonnement X à deux niveaux d'énergie différents transmis à travers les particules, et de détermination de la concentration du constituant dans les particules à partir des intensités détectées.

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