A method and cell for freezing formation layer sample tests

Details A method and cell for freezing formation layer sample tests A method and cell for freezing formation layer sample tests

G - Physics

01

N

73/78

G01N 25/16 (2006.01) G01N 3/18 (2006.01) G01N 3/00 (2006.01) G01N 3/02 (2006.01) G01N 33/24 (2006.01)

Patent

CA 2004389

T 5942 A B S T R A C T A METHOD AND CELL FOR FREEZING FORMATION LAYER SAMPLE TESTS A method for determining temperature dependant stress-strain characteristics of a formation layer sample comprises the following steps: a) simulating characteristic underground conditions for said sample, b) creating an axial central hole in said sample which functions as a coolant conduit, c) arranging said sample in a triaxial cell in which said sample is loaded to predetermined test pressures, d) cooling said sample during a freezing process outwardly from said central hole by circulating a coolant through the central hole while exerting said test pressures, and e) monitoring during said freezing process temperature dependant sample parameters with which said stress-strain characteristics are determined.

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