G - Physics – 01 – M
Patent
G - Physics
01
M
G01M 99/00 (2011.01) G01M 15/00 (2006.01) G07C 3/00 (2006.01)
Patent
CA 2550315
A method for diagnosing and classifying faults in a system (10) is provided. The method comprises acquiring operational data for at least one of a system (10), one or more subsystems (12) of the system (10) or one or more components (20) of the one or more subsystems (12). Then, the method comprises analyzing the operational data using one or more diagnostic models (113). Each diagnostic model (113) uses the operational data to determine a probability of fault associated with at least one of the one or more components (20) or the one or more subsystems (12). Finally, the method comprises deriving an overall probability of fault for at least one of the system (10), the one or more subsystems (12), or the one or more components (20) using the one or more probabilities of fault determined by the one or more diagnostic models (113) and one or more hierarchical relationships between the subsystems (12) and components (20) of the system (10).
Cleary Daniel Joseph
Osborn Mark David
Yu Lijie
Company General Electric
Craig Wilson And Company
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