A method for measuring deformations in test specimens and a...

G - Physics – 01 – B

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G01B 21/32 (2006.01) B23K 26/18 (2006.01) G01N 3/02 (2006.01)

Patent

CA 2545242

A process and device for marking and measuring test specimens in order to determine the deformation properties of the test specimen utilizing an energy based system for creating high resolution gauge marks.

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