G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 27/64 (2006.01)
Patent
CA 2432026
A method for the quantitative analysis of the concentration of impurities in helium by means of ion mobility spectrometry is described, which consists in using purified argon together with the helium which has to be analyzed for forming the sample, or pure argon as counterflow gas in the separation zone of the instrument, or finally helium-purified argon mixtures both for the sample gas and for the counterflow gas.
L'invention concerne un procédé destiné à l'analyse quantitative de la concentration d'impuretés dans l'hélium par spectrométrie de mobilité ionique. Ce procédé consiste à utiliser de l'argon purifié avec de l'hélium à analyser pour former l'échantillon ou de l'argon pure comme gaz à contre-courant dans la zone de séparation de l'instrument ou, finalement, des mélanges d'argon purifié et d'hélium à la fois pour le gaz échantillon et pour le gaz à contre-courant.
Bonucci Antonio
Pusterla Luca
Stimac Robert
Succi Marco
Gowling Lafleur Henderson Llp
Saes Getters S.p.a.
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