A process and device for measurement of spectral induced...

G - Physics – 01 – V

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G01V 3/06 (2006.01)

Patent

CA 2674377

A process and device for measurement of spectral induced polarization response of subsurface over a wide band of frequencies (0.03 Hz to 100 Hz) using pseudo noise current source, is provided. (Pseudo Random Binary Sequence current source).The measurement setup employs a current source (500VA) and a computer controlled real time correlator for excitation of the subsurface. The current from the source is reversed through the grounded electrodes in a Pseudo Random Binary Sequence (PRBS) and the computer based receiver essentially computes Auto (input-input) and Cross (input- output) correlation estimates in the field. The collected data (time series) is transformed into frequency domain (DFT) in order to obtain the phase spectrum. The receiver has a provision to stack data for an improved S/N ratio. Measurements taken in laboratory using simple RC network, which simulates the subsurface, are accurate.Accuracy of measurement is better than 2 % in Band-I (0.031 - 2 Hz) and 1 % in Band- Il (2-100 Hz) respectively.

L'invention porte sur un procédé et un dispositif de mesure de la réponse de polarisation spectrale induite, de sous-surfaces, sur une large bande de fréquences (0,03 Hz à 100 Hz) utilisant une source de courant de pseudo bruit. (source de courant de séquences binaires pseudo aléatoires). L'installation de mesure emploie une source de courant (500VA), et un corrélateur en temps réel commandé par ordinateur pour l'excitation de la sous-surface. Le courant de la source est inversé par l'intermédiaire d'électrodes à la terre dans une séquence binaire pseudo aléatoire (PRBS), et le récepteur à base d'ordinateur calcule essentiellement les corrélation auto (entré-entrée) et croisées (entrée-sortie) du champ. Les données recueillies (séries temporelles) sont transformées en domaine de fréquence (DFT) pour obtenir le spectre de phase. Le récepteur a une capacité d'empilement de données à rapport signal/bruit amélioré. Les mesures en laboratoire utilisant un simple réseau RC, qui simule la sous-surface, sont précises. L'exactitude de mesure est meilleure que 2 % dans la bande I (0,031 - 2 Hz) et que 1 % dans la bande Il (2-100 Hz).

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