A sampling device for automatic elemental analysers

G - Physics – 01 – N

Patent

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Details

G01N 31/12 (2006.01) G01N 1/00 (2006.01) G01N 30/04 (2006.01)

Patent

CA 2458721

The present invention relates to a sampler, in particular for automatic elemental analysers, comprising loading means (121), a guide (128) containing an admission piston (126), a first purge chamber (134) for a sample (103) to be analysed, an admission system (133) for a purge gas into the first purge chamber (134), said first purge chamber (134) comprising a passage (136) of the admission piston (126), said admission piston (126) being movable between a drop position (124) and admission position (127) for the sample (103) to be analysed. According to the invention, a second inner chamber (51) in the sampler (102) is comprised, near the distal end of the admission piston (126).

La présente invention concerne un échantillonneur, notamment destiné à des systèmes d'analyse élémentaire automatiques. Cet échantillonneur comprend des systèmes de chargement (121), un guide (128) comprenant un piston d'admission (126), une première enceinte de purge (134) destinée à un échantillon à analyser (103), ainsi qu'un système d'admission (133) destiné à un gaz de purge à admettre dans la première enceinte de purge (134). Ladite première enceinte de purge (134) comprend un passage (136) pour le piston d'admission (126). Ce piston d'admission (126) peut se déplacer entre une position de chute (124) et une position d'admission (127) pour l'échantillon (103) qui doit être analysé. L'échantillonneur (102) selon cette invention comprend une seconde enceinte interne (51) qui est située à proximité de l'extrémité distale du piston d'admission (126).

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