A sift-ms instrument

Details A sift-ms instrument A sift-ms instrument

H - Electricity

01

J

H01J 49/40 (2006.01)

Patent

CA 2666288

The invention described is a method of improving the signal intensity of the precursor ions constrained in a carrier gas in the flow tube of a SlFT-MS instrument. The improved method is the step of applying an electrical potential to the flow tube to lower the diffusive loss of ions within the flow tube. The lowered diffusive loss of ions increases the sensitivity of the technique. An apparatus for carrying out the method is dercribed.

La présente invention concerne un procédé d'amélioration de l'intensité de signal des ions précurseurs contraints dans un gaz porteur dans le tube d'écoulement d'un instrument SIFT-MS. Le procédé amélioré est l'étape d'application d'un potentiel électrique sur le tube d'écoulement pour y abaisser la perte de diffusion d'ions. La diminution de perte de diffusion des ions augmente la sensibilité de la technique. Un appareil pour exécuter le procédé est également décrit.

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