A time-of-flight mass spectrometer with improved data...

Details A time-of-flight mass spectrometer with improved data... A time-of-flight mass spectrometer with improved data...

B - Operations, Transporting

01

D

B01D 59/44 (2006.01) H01J 49/00 (2006.01)

Patent

CA 2507491

Time-of-flight mass spectrometer instruments are disclosed for monitoring fast processes with large dynamic range using a multi-threshold TDC data acquisition method or a threshold ADC data acquisition method. Embodiments using a combination a combination of both methods are also disclosed.

L'invention se rapporte à des instruments du type spectromètre de masse à temps de vol permettant de contrôler des processus rapides à plage dynamique étendue par mise en oeuvre d'un procédé d'acquisition de données avec conversion temps-numérique à seuils multiples ou d'un procédé d'acquisition de données avec conversion analogique-numérique à niveau seuil. Des modes de réalisation fondés sur une combinaison de ces deux procédés sont également décrits.

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