Abnormally low reflectance photoconductor sensing system

G - Physics – 03 – G

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314/7

G03G 15/00 (2006.01)

Patent

CA 1092185

ABNORMALLY LOW REFLECTANCE PHOTOCONDUCTOR SENSING SYSTEM Abstract of the Disclosure A system for checking copy quality variables within the image area of an electrophotographic machine. During a test cycle, quality is checked by producing sample test areas within the photoconductor image area ordinarily used for producing copies. Reflectance measurements are made on the sample test areas and compared to a dynamically floating reference achieved by a reflectance measurement from a cleaned portion within the image area of the photocon- ductor. The testing circuit is balanced so that the same reflectance voltage should be generated whether the single reflectivity-sensing device is viewing a sample test area or a cleaned reference area. The system checks for quality variables such as toner concentration, image voltage, and an abnormally low reflectance photoconductor and provides a partial check on its own fault-free condition during periods when it is not in use.

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