G - Physics – 08 – B
Patent
G - Physics
08
B
340/123.2
G08B 23/00 (2006.01) G01N 21/89 (2006.01)
Patent
CA 1158333
ABSTRACT OF THE DISCLOSURE A laser inspection system is provided having an absolute dc system in which the power gain of the system is stable and adjustable in order that the resultant signals which are generated from the system may be utilized to identify flaws as distinguished from flaws which may be identified simply by a change in signal relative to the background value. In order to stabilize the power gain of the system and provide an absolute reference dc level or back- ground, a sample of the radiation from the laser beam which is utilized to scan the material being inspected is applied to the photomultiplier tube for generating a reference pedestal signal which is dependent on the intensity of the laser beam and is free of the influence of the characteristics of the material or product being inspected. The reference pedestal signal is applied to a comparator which develops a control signal which is applied in a single feedback loop which includes in effect the laser source and the light collec- tion system or receiver within the loop. This loop includes the photo- multiplier tube and its high voltage power supply to which the control signal is applied for stabilizing the gain of the system. Accordingly, if the sensitivity of the receiver varies, or the photomultiplier drifts or if drift occurs in the power supply of the photomultiplier tube, or if the laser beam intensity drifts, the feedback loop will detect these changes and compensate for them, produce a stable and adjustable power gain for the system. Accord- ingly, changes in response of the photomultiplier tube with respect to a pro- duct being examined will be due to product type changes, for example, products which differ in diffusivity, reflectivity, etc., and will not be due to changes in the system parameters such as sensitivity, temperature, etc.
371985
Intec Corporation
Smart & Biggar
LandOfFree
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