G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/25 (2006.01)
Patent
CA 2724495
A system and method for the analysis of composite materials. Improved techniques for the measurement of the shape and position of the composite article are provided, which include improved scanning rates using structured light.
L'invention porte sur un système et sur un procédé pour l'analyse de matériaux composites. L'invention porte sur des techniques améliorées pour la mesure de la forme et de la position de l'article composite, lesquelles comprennent des vitesses de balayage améliorées à l'aide d'une lumière structurée.
Do Tho X.
Drake Thomas E. Jr.
Dubois Marc
Kaiser David L.
Osterkamp Mark A.
Finlayson & Singlehurst
Lockheed Martin Corporation
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