Achromatic and compact optical interferometer of the...

G - Physics – 01 – J

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G01J 9/02 (2006.01)

Patent

CA 2636881

The invention concerns a method and a device for analyzing a wave surface of a light beam, which consists in placing a diffraction grating (GR) in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analyzing plane. Different emergent beams of the grating interfere by forming an image the deformations of which are related to the gradients of the analyzed wave surface. The method is characterized in that the grating (GR) multiplies an intensity function, produced by a hexagonal mesh two-dimensional grating (GI) with surface S transmitting the light of the beam to be analyzed in several emergent beams in accordance with a hexagonal mesh with a phase function, produced by a hexagonal mesh grating (GP) with surface 3S which introduces, between two adjacent emergent beams a phase-shift equal to 2.pi./3 (modulo 2.pi.) .

Procédé et dispositif pour l'analyse de surface d'onde d'un faisceau de lumière, dans lequel on place un réseau de diffraction GR dans un plan perpendiculaire au faisceau de lumière à analyser et optiquement conjugué du plan d'analyse. Différents faisceaux émergents du réseau interfèrent en formant une image dont les déformations sont liées aux gradients de la surface d'onde analysée. Le procédé est caractérisé en ce que le réseau (GR) réalise la multiplication d'une fonction d'intensité, réalisée par un réseau bidimensionnel (GI) à maille hexagonale de surface S transmettant la lumière du faisceau à analyser en plusieurs faisceaux émergents disposés suivant un maillage hexagonal avec une fonction de phase, réalisée par un réseau bidimensionnel (GP) à maille hexagonale de surface 3S qui introduit, entre deux faisceaux émergents adjacents un déphasage égal à 2.pi./3 (modulo 2.pi.) .

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