Acid phthalate crystal

H - Electricity – 05 – G

Patent

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Details

358/27, 148/3.5

H05G 1/00 (2006.01) G01N 23/207 (2006.01) G21K 1/06 (2006.01)

Patent

CA 1134069

1 PHA. 20,884. ABSTRACT: An X-ray analyzing crystal of acid phthalate is given good deterioration resistant qualities, in that a relatively inert layer is disposed at the surface of said layer, which is intended for impingement by X-rays when used in an X-ray analyzing system, the layer having a thickness below about 0.2 µm and consisting essentially of metal or metalloid having a good inertness to the ambient atmosphere. The crystal shows an improved deter- ioration resistance and, hence, an elongated life-time.

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