Adjustable quick-mount test probe assembly

Details Adjustable quick-mount test probe assembly Adjustable quick-mount test probe assembly

G - Physics

01

R

356/2, 324/58.1

G01R 31/02 (2006.01)

Patent

CA 1270962

ADJUSTABLE QUICK-MOUNT TEST PROBE ASSEMBLY Abstract of the Disclosure An adjustable quick-mount test probe assembly for use in circuit testing. The test probe assembly provides a convenient means for testing printed circuit boards contain- ing Very Large Scale Integrated (VLSI) components and high density interconnect substrates. This is due to its ver- satility in terms of positioning and its use of replaceable, "of-the-shelf" test probe tips. The test probe assembly provides a means of quickly connecting test clips from a test equipment unit to a circuit board, as well as providing a means of neatly arranging test leads to avoid the possibility of entanglement and reducing strain on the test probe. Test set-up time is greatly reduced, and confidence of test set-up integrity is increased. - i -

552887

Affiliated with

Also associated with

Rating

Adjustable quick-mount test probe assembly does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Adjustable quick-mount test probe assembly, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Adjustable quick-mount test probe assembly will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1191229