Adjustable system for skew comparison of digital signals

Details Adjustable system for skew comparison of digital signals Adjustable system for skew comparison of digital signals

G - Physics

01

R

328/82

G01R 31/28 (2006.01) G01R 31/317 (2006.01) G01R 31/3193 (2006.01) G01R 31/319 (2006.01)

Patent

CA 1263456

ABSTRACT OF THE DISCLOSURE A plurality of digital signals from a standard reference digital module can be compared to the corresponding digital signals from a comparable module undergoing test. Thus, a plurality of output signals from the reference module can be compared with the comparable plurality of digital signals from the module under test. A select multiplexor receives the pairs of signals from the source modules and conveys the signal pairs to each of a plurality of skew comparison circuits for analysis and error reporting to a maintenance controller processor. The select multiplexor also permits a self-test generator to check out the skew compare circuitry and also permits a mask register, programmed by the maintenance controller processor, to select only those signal pairs which it is desired to analyze, rather than merely checking all the available pairs of lines in the system.

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