Admittance measuring system for monitoring the condition of...

Details Admittance measuring system for monitoring the condition of... Admittance measuring system for monitoring the condition of...

G - Physics

01

N

324/43

G01N 27/02 (2006.01) G01R 27/02 (2006.01)

Patent

CA 1102411

M-569-1 ADMITTANCE MEASURING SYSTEM FOR MONITORING THE CONDITION OF MATERIALS Abstract of the Disclosure A two-wire transmitter includes an admittance sensing probe adapted to sense the conditions and corresponding admit- tance of materials. The probe is coupled into an admittance responsive network which generates an admittance signal repre- senting the condition of materials. The output current from the transmitter is varied in response to the admittance signal. In the embodiment of the invention, the admittance responsive network comprises a variable frequency oscillator whose frequency varies with the admittance of the materials. In another embodiment, the admittance responsive network comprises a ramp generator with a frequency which varies with the admittance of the materials. In another embodiment, the admittance responsive network comprises a bridge whose balance changes in response to the admittance of the materials.

291340

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