Advanced programmed sample processing system and methods of...

G - Physics – 01 – N

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G01N 5/02 (2006.01) G01N 1/31 (2006.01) G01N 15/06 (2006.01) G01N 21/00 (2006.01) G01N 27/04 (2006.01) G01N 27/12 (2006.01) G01N 31/00 (2006.01) G01N 33/48 (2006.01) G01N 35/00 (2006.01) G01N 1/30 (2006.01)

Patent

CA 2508370

A sample processing system (101) that may be automated and methods are disclosed where sample(s) (198) are arranged on a carrier element (197) and a process operation control system (171) automatically processes the sample(s) perhaps robotically with a sample process parameter input (173) that may be independent and an independent process parameter memory that does not interrupt process operation when being used. There may be an interspersial robotic control element responsive to an automatic data replication memory and to which a robotic motion system is responsive.

L'invention concerne un système de traitement d'échantillons (101) pouvant être automatisé, ainsi que des procédés selon lesquels un ou plusieurs échantillons (198) sont placés sur un élément support (197) et un système de commande des opérations de traitement (171) traite automatiquement ce ou ces échantillons, éventuellement de façon robotisée, au moyen d'une entrée de paramètres de traitement d'échantillons (173) pouvant être indépendante et une mémoire de paramètres de traitement indépendante qui n'interrompt pas les opérations de traitement lors de son utilisation. Le système selon l'invention peut comprendre un élément de commande robotisé intercalaire réagissant à une mémoire de reproduction de données automatique et auquel réagit un système de mouvement robotisé.

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