An apparatus for reduction of selected ion intensities in...

Details An apparatus for reduction of selected ion intensities in... An apparatus for reduction of selected ion intensities in...

H - Electricity

01

J

H01J 49/42 (2006.01) H01J 49/10 (2006.01)

Patent

CA 2335108

An apparatus for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the apparatus has an ion trap or a collision cell containing a reagent gas wherein the reagent gas accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the collision cell as employed in various locations within analytical instruments including an inductively coupled plasma mass spectrometer.

L'invention porte sur un appareil produisant un faisceau d'ions présentant une portion accrue d'ions d'un analyte donné, par rapport aux ions du gaz porteur. L'appareil comporte spécifiquement un piège à ions ou une cellule de collision contenant un gaz réactif qui accepte les charges d'ions de l'analyte et neutralise par là sélectivement les ions du gaz porteur. L'invention porte également sur la cellule de collision utilisée en différents endroits de l'instrument d'analyse, dont un spectromètre de masse à plasma à couplage inductif.

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