G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 21/956 (2006.01) B41F 17/00 (2006.01) B41F 33/00 (2006.01) B41M 3/14 (2006.01) G01N 21/89 (2006.01)
Patent
CA 2525048
According to the present invention, there is provided a printed graphics inspection system and the inspection method thereof to inspect printed graphics including holograms. In the present invention improving the printing quality and reducing manpower cost are achieved by using of a plurality of sensors located in different angles to exclude zones not normally detectable on the graphics to be inspected, digitalizing the images inspected by such sensors, sending the digitalized images to a micro-processor, and using such micro-processor to analyze and process the images inspected and a set of corresponding templates to identify defects such as contamination, color deviation and the like.
Han Wenjiang
Li Wende
Tang Huiming
Zhang Jian
Gowling Lafleur Henderson Llp
Han Wenjiang
Zhang Jian
LandOfFree
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