Analysis appliance for analysis of a sample on a test element

G - Physics – 01 – N

Patent

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Details

G01N 33/487 (2006.01) G01N 33/50 (2006.01)

Patent

CA 2631660

The invention relates to an analysis appliance for analysis of a sample on a test element, containing at least one component (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) which makes electrical contact for electrical power transmission, which is suitable for producing an electrical contact with at least one further component. In this case, the component (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) which makes electrical contact is an injection-molded circuit mount (MID) (molded interconnect device).

L'invention concerne un appareil d'analyse pour analyser un échantillon sur un élément d'essai, cet appareil comprenant au moins un élément de contact électrique (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) transmettant le courant et apte à établir un contact électrique avec au moins un autre élément. L'élément de contact électrique (123, 124, 125, 126, 127, 128, 129, 130, 131, 132) est un support de circuit moulé par injection (MID).

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