G - Physics – 01 – N
Patent
G - Physics
01
N
73/164, 354/30
G01N 27/22 (2006.01)
Patent
CA 1117218
Abstract of the Disclosure An analysis instrument for measuring selected constituents present in a sample of a material such as a bulk commodity includes a test cell to receive the sample. The test cell comprises a capacitor whose electrical pro- perties are modified in accordance with the dielectric constant of the sample, which dielectric constant is a function of the contents of the sample. Weight and tem- perature sensors are provided for producing signals corresponding to the weight and temperature of the sample in the test cell. An electronic measuring circuit is connected to a test circuit including the test cell capa- citor and to the weight and temperature sensors for pro- ducing an indication of the contents of the sample. The measuring circuit produces the indication by correcting a measurement taken across the test cell in accordance with the variation in the temperature of the sample from a reference temperature and the variation in the bulk density of the sample from a reference bulk density. Control circuits are provided for controlling the overall operation of the analysis instrument in accordance with predeter- mined instructions stored therein and with operator in- structions from a control panel.
300793
Dickey-John Corporation
Smart & Biggar
LandOfFree
Analysis instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analysis instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis instrument will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-19125