Analysis system for analyzing a sample on a test element

Details Analysis system for analyzing a sample on a test element Analysis system for analyzing a sample on a test element

G - Physics

01

N

G01N 37/00 (2006.01) G01N 1/28 (2006.01) G01N 21/01 (2006.01)

Patent

CA 2511204

The invention relates to an analysis system for analyzing a sample (12) on a test element (5), comprising - an analysis unit for generating a signal as a function of an analyte contained in a sample (12), and - a detection unit for detecting the signal. The analysis system comprises a test element holder (19) into which the test element (5) can be reversibly introduced and in which it can be positioned relative to the analysis unit and the detection unit. The test element (19) contains at least one guide element (20) which is suitable for laterally guiding the test element (5), so that the test element (5) in the test element holder (19) is held and guided only on an outer region (23) of the test element (5), and an inner region (24) of the test element (5) introduced into the test element holder (19) remains free. The test element (5) contains a sample application site (10) in the inner region (24).

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