Analyzer featuring a contacting reflectometer

Details Analyzer featuring a contacting reflectometer Analyzer featuring a contacting reflectometer

G - Physics

01

N

73/58

G01N 21/17 (2006.01) G01N 21/47 (2006.01) G01N 35/00 (2006.01)

Patent

CA 1150970

- 0 - ANALYZER FEATURING A CONTACTING REFLECTOMETER Abstract In an analyzer of the kind in which a reflecto- meter contacts a test element during scanning of the element, means are provided for moving test elements to and from the reflectometer in a manner avoiding signifi- cant contact wear of the reflectometer.

382947

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