H - Electricity – 01 – L
Patent
H - Electricity
01
L
148/2.4, 148/3.7
H01L 29/12 (2006.01) H01L 21/20 (2006.01) H01L 21/205 (2006.01) H01L 29/06 (2006.01)
Patent
CA 1320103
ANNEALING METHOD FOR III-V DEPOSITION Abstract of the Disclosure A method for producing wafers having deposited layers of III-V materials on Si or Ge/Si substrates is disclosed. The method involves the use of multiple in situ and ex situ annealing steps and the formation of a thermal strain layer to produce wafers having a decreased incidence of defects and a balanced thermal strain. The wafers produced thereby are also disclosed.
582969
Lee Jhang Woo
Mccullough Richard E.
Kopin Corporation
Ogilvy Renault Llp/s.e.n.c.r.l.,s.r.l.
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