Anti-symmetrized electromagnetic measurements

Details Anti-symmetrized electromagnetic measurements Anti-symmetrized electromagnetic measurements

G - Physics

01

V

G01V 3/18 (2006.01) E21B 47/026 (2006.01) G01V 3/28 (2006.01) G01V 3/30 (2006.01)

Patent

CA 2544111

A method to determine a parameter of a subsurface formation such as anisotropy and dip comprises making at least two cross dipole measurements and forming an anti-symmetrized combination from the at least two cross dipole measurements.

L'invention concerne une méthode pour déterminer si un paramètre d'une formation sous- superficielle comme une anisotropie et un pendage se compose d'au moins deux mesures de dipôles croisés et forme une combinaison anti-symétrisées d'au moins deux mesures de dipôles croisés.

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