Apparatus and method for analysis of specimens and testing...

G - Physics – 06 – M

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73/124, 340/124.

G06M 7/00 (2006.01) B01L 99/00 (2010.01) G01N 21/90 (2006.01) G06M 9/00 (2006.01) G06M 11/00 (2006.01) G01N 33/00 (2006.01)

Patent

CA 1087267

ABSTRACT OF THE DISCLOSURE In the analysis of specimens, a carrier having mounted thereon a plurality of cuvettes containing specimens to be analysed is advanced to cause each cuvette to pass repeatedly through, in succession, a specimen loading region in which specimens are introduced into the cuvettes while they are located in that region, an analysis region in which an analytical test is performed on the specimens in the cuvettes in the analysis region, and a cleaning region in which the cuvettes are cleaned when in that region. In order to test the state of cleanliness of the cuvettes after cleaning, they are passed by the carrier through a cleanliness testing region before returning to the loading region. The effective use of any cuvette which fails the cleanliness test to which it is subjected while in the cleanliness testing region is inhibited at least until that cuvette is again cleaned. -1-

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