G - Physics – 01 – B
Patent
G - Physics
01
B
33/179
G01B 7/28 (2006.01) G01B 5/20 (2006.01)
Patent
CA 2016215
ABSTRACT OF THE DISCLOSURE An inspection apparatus for measuring a surface contour on a workpiece, such as a groove in a pilgering roller die, includes a supporting mechanism for rotatably clamping the die so as to orient the groove thereon in a measurement position, an elongated contact member having a pair of arms with and elements extending in opposite directions, a pair of measurement devices each including a displaceable contact probe and electrical circuitry for measuring the displacement of the contact probe, and a spindle mounting the contact member in a generally vertical orientation and for movement about a vertical axis. End elements on the contact member arms are movable along orthogonally-disposed axes lying in horizontal planes and are respectively placed in contact with a contour of the die groove to be measured and the displaceable contact probes such that displacement of the probes permits measurement of the radius of the groove contour.
Cady Albert B.
Cross Michael
Bereskin & Parr
Cady Albert B.
Cross Michael
Westinghouse Electric Corporation
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