Apparatus and method for detecting defects in a...

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G - Physics

01

R

G01R 31/28 (2006.01) H04N 3/15 (2006.01) H04N 17/00 (2006.01)

Patent

CA 2316746

A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector (22) used in a digital x-ray system (10). The technique employs test circuits (122, 124, 126) associated with each row driver (46) of the detector. The test circuits are enabled by a test enable signal (150), and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals (194, 184) from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.

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