Apparatus and method for measuring intermolecular...

G - Physics – 01 – Q

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Details

G01Q 60/24 (2010.01) G01Q 60/42 (2010.01) G01Q 70/18 (2010.01) C12Q 1/68 (2006.01) C40B 30/00 (2006.01) C40B 30/04 (2006.01) C40B 60/08 (2006.01) C40B 60/12 (2006.01) C40B 60/14 (2006.01) G01N 1/28 (2006.01) G01N 33/53 (2006.01) G01N 33/543 (2006.01) G01N 33/566 (2006.01)

Patent

CA 2331585

A sample support member for atomic force microscopy of intermolecular interactions includes a sample support base (40) having a plurality of protrusions (45), each protrusion (45) having an apical substrate region (48) or tip that has been chemically modified by the immobilization thereon of a sample compound (50) or of a linking compound that is capable of binding a sample compound. A reference compound support member (10), shaped as a cantilever, has a surface region (20) having at least one reference compound (30) immobilized thereon. A physical parameter associated with the interaction between the reference compound (20) and the sample compound (50) can be measured while controlling the spacing between the two support members.

L'invention concerne un élément support pour échantillon utilisé en microscopie à forces atomiques afin de mesurer des interactions intermoléculaires. Cet élément support comprend une base (40) présentant plusieurs protubérances (45), chacune de ces protubérances (45) étant constituée d'une zone (48) ou d'une extrémité supérieures chimiquement modifiées par l'immobilisation, sur cette zone ou cette extrémité, d'un composé à examiner (50), ou d'un composé de liaison capable de se fixer à un composé à examiner. Un élément support (10) pour composé témoin, se présentant sous la forme d'un bras en porte-à-faux, comporte une zone superficielle (20) sur laquelle a été immobilisé au moins un composé témoin (30). On peut ainsi mesurer un paramètre physique associé à l'interaction entre ledit composé témoin (20) et ledit composé à examiner (50) tout en réglant l'espace séparant les deux éléments supports.

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