Apparatus and method for non-destructive testing of structures

Details Apparatus and method for non-destructive testing of structures Apparatus and method for non-destructive testing of structures

G - Physics

01

M

G01M 5/00 (2006.01) G01B 5/30 (2006.01) G01B 11/16 (2006.01) G01M 11/08 (2006.01)

Patent

CA 2097781

APPARATUS AND METHOD FOR NON-DESTRUCTIVE TESTING OF STRUCTURES ABSTRACT OF THE DISCLOSURE A method and apparatus for non-destructive testing of the load bearing characteristics of a structure are disclosed. An interferometer is supported by a beam which is supported away from the surface of the structure to be tested. The interferometer is used to measure a quantity which varies with the distance between the interferometer and a reflecting means supported on the location to be tested. The reflecting means is supported in such a manner as to move responsively with deformations to the said location, and is typically attached to a probe which is urged against the said location. Preferably a force is applied or varied near the location to be tested and comparisons are made over time or as the said force varies. Such a system does not damage the structure, and does not require complicated equipment or processing.

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