G - Physics – 01 – B
Patent
G - Physics
01
B
354/21
G01B 7/28 (2006.01) G01B 11/02 (2006.01)
Patent
CA 1098209
ABSTRACT OF THE DISCLOSURE An apparatus and method for measuring operator- selected dimensions of a sample workpiece or part in an inspection field and, in one embodiment of the invention, for subsequently and automatically measuring the same dimensions of parts subsequently positioned in the inspection field. In accordance with one aspect of the invention, there is provided a means for optically scanning a sample part in the inspection field and means for effecting display of the part in the inspec- tion field. An operator-positionable cursor is provided for selecting and displaying the coordinates of reference points in the inspection field. Means are provided for storing an operator-selected reference point and, also for storing an operator-selected pattern. The operator-selected pattern is scanned with respect to the part, the pattern originating from the operator-selected reference points. Means are also provided for determining at least one dimension of the part, the dimension being determined as a function of the inter- sections of the pattern with the part. In one form of the invention, means are provided for optically scanning parts subsequently positioned in the inspection field. The scan pattern used in scanning the subsequent parts is determined by the stored reference point and the stored pattern. Further means are provided for determining at least one dimension of each subsequent part in the inspection field, the dimension being determined as a function of the intersections of the scan pattern with the subsequent part. In this manner, the same dimension of all subsequent parts is automatically measured. In the preferred embodiment of the invention, means are provided for storing an operator-selected tolerance with respect to the at least one dimension of the sample part and for determining whether the at least one dimension of the subsequent part is within the operator-selected tolerance. In this embodiment, means are also provided for determining the centroid and relative rotational orientation in the inspection field of the sample part and the subsequent part, and for effecting a coordinate transformation as between the parts such that different positions or orientations of subsequent parts in the inspection field are accounted for. -2-
263607
Lorincz Robert S.
Tucker Billy J.
Sangamo Weston Inc.
Smart & Biggar
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