Apparatus and method for rapid 3d image parametrization

Details Apparatus and method for rapid 3d image parametrization Apparatus and method for rapid 3d image parametrization

G - Physics

01

B

G01B 11/24 (2006.01) G01B 11/25 (2006.01)

Patent

CA 2275411

A method and apparatus for rapid three-dimensional geometry parametrization of a three-dimensional surface. A random speckle pattern is projected upon the surface and imaged to obtain a plurality of two-dimensional digital images. The two-dimensional images are processed to obtain a three-dimensional characterization of the surface. The illuminated surface may be modeled to obtain a parameter set characterizing the surface based upon the two- dimensional digital images.

La présente invention a trait à un procédé et un appareil destinés au paramétrage en géométrie tridimensionnelle d'une surface tridimensionnelle. Un modèle aléatoire de speckle est projeté puis représenté sur la surface afin de produire plusieurs images numériques bidimensionnelles. Les images bidimensionnelles sont traitées de façon à donner une caractérisation tridimensionnelle de la surface. La surface lumineuse peut être modélisée pour produire un ensemble de paramètres caractérisant la surface sur la base des images numériques bidimensionnelles.

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