Apparatus and method for spectrophotometric analysis

B - Operations – Transporting – 01 – L

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B01L 3/00 (2006.01) G01N 21/03 (2006.01)

Patent

CA 2626741

An apparatus for spectrophotometric analysis comprises a sample reception surface, which is arranged to receive a sample to be analysed, and a sample contacting surface, which is moveable in relation to the sample reception surface such that it may be brought to a first position, where the surfaces are sufficiently far apart to allow the sample to be placed on the sample reception surface, and a second position, where the sample contacting surface makes contact with the sample and compresses the sample. The apparatus further comprises a sample thickness controller, which is arranged to control the distance between the sample reception surface and the sample contacting surface in the second position of the sample contacting surface, such that a sample thickness between the surfaces may be shifted for obtaining at least two measurements of the sample at different optical path lengths through the sample.

La présente invention concerne un appareil destiné à des analyses spectrophotométriques qui comprend une surface de réception d~échantillon, agencée de manière à recevoir un échantillon à analyser, et une surface de contact d~échantillon qui peut se déplacer par rapport à la surface de réception d~échantillon de manière à se trouver dans une première position, dans laquelle les surfaces sont suffisamment éloignées pour pouvoir permettre à l~échantillon d~être placé sur la surface de réception d~échantillon, et une seconde position, dans laquelle la surface de contact de l~échantillon vient au contact de l~échantillon et comprime ce dernier. L~appareil comprend également un dispositif de régulation de l~épaisseur de l~échantillon qui est monté de manière à réguler la distance entre la surface de réception de l~échantillon et la surface de contact de l~échantillon, qui se trouve dans la seconde position, de manière à pouvoir décaler l~épaisseur d~un échantillon entre les surfaces afin d~obtenir au moins deux mesures de l~échantillon à différentes longueurs de chemin optique sur l~échantillon.

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