Apparatus and method for testing contact interruptions of...

G - Physics – 01 – R

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Details

324/67, 324/58.1

G01R 31/04 (2006.01) G01R 29/027 (2006.01) G01R 31/02 (2006.01)

Patent

CA 1273999

Abstract Apparatus and method are disclosed for identifying and measuring random contact interruption events in a circuit interconnection device. A comparator circuit, adapted to operated at high frequencies, identified when an interrupt event has occurred. The comparator circuit, as a result of the interruption event, causes a high frequency counter circuit to count clock pulses. The count in the clock circuit is continuously applied to an RAM memory circuit, write-enabled at an addressed memory location. After the interruption event is terminated, the RAM memory circuit is not longer write enabled at the addressed location and the addressed location is changed (incremented) in preparation for the next event. The counter circuit is also reset to zero in preparation for the next interruption event. The number of counts from a clock unit having a known frequency provides the duration of the interruption event. With the use of a clock unit operated at 100 MHz, interrupt events from 10 nanoseconds to 9.99 microseconds can be identified. Because of the frequency at which the testing is performed, the input impedance of the comparator circuit must be matched to the impedance of the circuit interconnection device.

558586

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