Apparatus and method for the control and/or analysis of...

Details Apparatus and method for the control and/or analysis of... Apparatus and method for the control and/or analysis of...

H - Electricity

01

J

358/7

H01J 49/42 (2006.01)

Patent

CA 1306073

ABSTRACT APPARATUS AND METHOD FOR THE CONTROL AND/OR ANALYSIS OF CHARGED PARTICLES A method of analysis of a gaseous sample comprises the steps of introducing into a quistor a sample of ions characteristic of the gaseous sample, applying a potential to the electrodes of said quistor so that only one ionic species is stable in a trap of said quistor at any given instant, incrementing the potential applied to the electrodes of said quistor so that said ionic species becomes unstable and is ejected from said trap and determining the mass/change ratio from the measurements of the parameters of said ion trap at the point of instability.

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