Apparatus and method for transient thermal infrared emission...

Details Apparatus and method for transient thermal infrared emission... Apparatus and method for transient thermal infrared emission...

G - Physics

01

N

73/51

G01N 21/71 (2006.01) G01N 25/72 (2006.01) G01N 21/85 (2006.01)

Patent

CA 2024807

2024807 9008311 PCTABS00001 A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) to a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 20) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.

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