G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 5/28 (2006.01) B81B 3/00 (2006.01) G01L 1/24 (2006.01) G01L 5/00 (2006.01)
Patent
CA 2376325
An apparatus to measure micro-forces includes a cantilever palette with a set of cantilever array blocks. Each cantilever array block includes a set of cantilevers, with each cantilever including a set of cantilever fingers surrounded by a frame with frame fingers. The cantilever fingers and the frame fingers form a diffraction grating. Each cantilever array block is configured to be responsive to a predetermined micro-force, such that the cantilevers of the cantilever array block deflect in the presence of the predetermined micro- force, which causes the diffraction grating to diffract light and thereby provide a visual indication of the presence of the predetermined micro-force.
L'invention concerne un appareil destiné à mesurer des micro-forces, équipé d'une palette en porte-à-faux comprenant un ensemble de blocs en porte-à-faux. Chaque bloc en porte-à-faux comprend un ensemble de porte-à-faux, et chaque porte-à-faux comprend un ensemble de doigts en porte-à-faux entourés d'une structure pourvue de doigts. Les doigts en porte-à-faux et les doigts de la structure forment un réseau de diffraction. Chaque bloc en porte-à-faux est configuré de manière à répondre à une micro-force prédéterminée, de façon que les porte-à-faux du bloc en porte-à-faux soient déviés en présence de la micro-force prédéterminée, permettant ainsi au réseau de diffraction de diffracter de la lumière, générant ainsi une indication visuelle de la présence de la micro-force prédéterminée.
Kwon Ohmyoung
Majumdar Arunava
Mao Minyao
Perazzo Thomas M.
Wu Guanghua
Regents Of The University Of California
Smart & Biggar
LandOfFree
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