G - Physics – 01 – B
Patent
G - Physics
01
B
324/33, 349/35
G01B 17/00 (2006.01) G01B 15/00 (2006.01) G01N 22/00 (2006.01) G01N 29/00 (2006.01)
Patent
CA 1099381
APPARATUS AND METHOD WHEREBY ENERGY IS CORRELATED WITH GEOMETRY OF A MANUFACTURED PART OR THE LIKE OR TO POSITIONAL RELATIONSHIPS IN A SYSTEM Abstract of the Disclosure A way of automatically inspecting a machined part, for example, to a tolerance of 0.001 inches. A minicomputer monitors a change in phase, for example, of wave energy impinging upon a sample part and compares it with a change in phase of such energy for a standard or master part, any difference between the monitored changes being interpreted to determine if the sample is within acceptable tolerance limits. The inspection approach described uses no moving parts and can be used to inspect many dimensions of a part simul- taneously in less than a second. Acoustic waves or microwave electromagentic wave energy can be used to inspect parts of any shape. The inspection system disclosed can be used, as well, to monitor the geometry of an object over time to note any changes in said geometry. And the concepts of the inspection system can be employed in conjunction with robot-controlled devices to provide close-positioning data for such devices.
276743
Buckley Bruce S.
Smart & Biggar
LandOfFree
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