G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/30 (2006.01) D21G 9/00 (2006.01) G01N 21/89 (2006.01) G01N 33/34 (2006.01)
Patent
CA 2277541
Measurement system and process for measuring a cross-direction profile of specific properties of at least one of a material web and a coming on the material web. The system includes at least one stationary cross-direction profile measurement device haying at least one radiation source adapted to irradiate the at least one of the material web and the coating on the material web in a plurality of defined and different wavelength ranges, and at least one sensor adapted to measure the intensity of radiation affected by the at least one of the material web and the coating on the material web. The system also includes at least one measurement and/or evaluation electronics system. Each sensor detects only one of the defined different wavelength ranges of the radiation at a specific point in time. The process includes irradiating the at least one of the material web and the coating on the material web with a plurality of defined and different wavelength ranges via at least one radiation source, and measuring an intensity of radiation affected by the at least one of the material web and the coating on the material web with at least one sensor. Only one of the defined different wavelength ranges of the radiation is measured by each sensor at a specific point in time.
Meinecke Albrecht
Munch Rudolf
Sim & Mcburney
Voith Sulzer Papiertechnik Patent Gmbh
LandOfFree
Apparatus and process for a cross-section profile of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and process for a cross-section profile of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and process for a cross-section profile of a... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1833760