G - Physics – 01 – R
Patent
G - Physics
01
R
324/44
G01R 27/26 (2006.01)
Patent
CA 1327994
Abstract of the Disclosure An apparatus for and a method of measuring capacitance employs a charge measuring system. While capacitive element, which may be an unknown capacitor, is charged completely to a predetermined voltage, a charge proportional to the capacitance of the capacitive element is accumulated on the feedback capacitor of an integrating operational amplifier. Thereafter, the charge is measured by measuring the time required to completely remove the charge from the feedback capacitor using the same predetermined voltage as a reference. In a preferred embodiment, the present invention is manifested as a capacitance measurement feature in a hand-held multimeter wherein a largely conventional dual-slope analog-to-digital converter is employed as the charge measuring system.
612537
G. Ronald Bell & Associates
John Fluke Mfg. Co. Inc.
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